Overview
- The KIER–CBNU team reports the findings in Advanced Functional Materials, confirming two distinct defect types in SHJ cells.
- The refined Deep Level Transient Spectroscopy method resolves a previously conflated signal into deep-level (slow) and shallow-level (fast) components.
- Separating the components enabled measurement of each defect’s energy level, position within the device, and atomic bonding configuration.
- Experiments show defect bonding configurations change with fabrication and operating conditions, with hydrogen driving these transformations.
- Researchers say the approach can guide targeted passivation, accelerate SHJ and tandem cell development, and be adapted to other semiconductor and display devices.